Gain Notes for Revolution 433
	
JEM-X1: A quite normal revolution with fine gain fitting. All the data from 
this revolution should be useable. The Xe analysis confirms that the energy
determination for this revolution is good, within about 2% of the ideal. 
However, as for all revolutions, the first few science windows should be
avoided in any analysis requiring very good gain determination. 

Two particular glitch events are shown in detail here:
A glitch cascade seen on source 1 (black/red) where multiple small glitches
occur one after the other.
An unusually large glitch on source 2 (yellow/pink) embedded amongst medium
sized glitches. Generally speaking, the two inner source (2 and 3) show less
noise and glitch activity than the outer two sources.

JEM-X2: No scientific data or gain history data for this unit.

CAO 4/07/2008